ADC parameters and characteristics - Part 6 in a series of tutorials in instrumentation and measurement

被引：0

作者：

Rapuano, Sergio ^{[1
]}

Daponte, Pasquale ^{[2
]}

Balestrieri, Eulalia ^{[2
]}

De Vito, Luca ^{[2
]}

Tilden, Steven J. ^{[3
]}

Max, Solomon ^{[4
]}

Blair, Jerome ^{[5
]}

机构：

[1] Faculty of Engineering, University of Sannio, Benevento, Italy

[2] Laboratory of Signal Processing and Measurement Information, University of Sannio, Benevento, Italy

[3] Texas Instruments, Inc., Tucson, AR, United States

[4] LTX Corporation, Westwood, MA, United States

[5] University of California, Berkeley, CA, United States

来源：

IEEE Instrumentation and Measurement Magazine | 2005年 / 8卷 / 05期

关键词：

Consumer electronics - Data acquisition - Digital to analog conversion - Electric grounding - Error correction - Precision engineering - Signal processing;

D O I：

10.1109/MIM.2005.1578617

中图分类号：

学科分类号：

摘要：

Analog-to-digital converters (ADC) presently available in recent application call for higher resolution and faster speed. The uncertainty of ADC performance strongly affects the overall system accuracy. Most ADC applications today can be classified into five broad market segments that include data acquisition, precision industrial measurement, voice band and audio, high speed and control loop applications. Subsequently, a very large percentage of these applications can be filled by successive-approximation (SAR) converters, Sigma-Delta converters and pipelined ADCs. Data acquisition circuits, ADC error measures and specific error measures are also presented.

引用

页码：44 / 54

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