Conductor loss diagnosis of grounding grid based on binary genetic algorithm

被引：0
|
作者：
Liu, Yugen [1 ]
Tian, Zi [1 ]
Lei, Chao [1 ]
Shang, Longlong [1 ]
Xie, Lina [1 ]
Chai, Yanli [2 ]
机构：
[1] State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University, Chongqing 400030, China
[2] Sanming Power Supply Company of State Grid Fujian Electric Power Co., Ltd., Sanming 365000, China
来源：
Gaodianya Jishu/High Voltage Engineering | 2014年 / 40卷 / 05期
关键词：
Corrosion;
D O I：
10.13336/j.1003-6520.hve.2014.05.021
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：1439 / 1445
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