Fast signal predictions of noised signals in eddy current testing

被引：29
|
作者：
Huang, Haoyu [1 ]
Takagi, Toshiyuki [1 ]
Fukutomi, Hiroyuki [1 ]
机构：
[1] Tohoku Univ, Sendai, Japan
来源：
IEEE Transactions on Magnetics | 2000年 / 36卷 / 4 I期
关键词：
D O I：
10.1109/20.877774
中图分类号：
学科分类号：
摘要：
Eddy current testing
引用
收藏
页码：1719 / 1723
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