共 50 条
- [1] The application of a wafer surface scanner to spacecraft contamination control OPTICAL SYSTEMS CONTAMINATION AND DEGRADATION, 1998, 3427 : 154 - 165
- [2] Spacecraft contamination, active cleaning and control OPTICAL SYSTEMS CONTAMINATION AND DEGRADATION, 1998, 3427 : 56 - 64
- [5] Dynamic Simulation of Deposition Processes of Spacecraft Molecular Contamination TEHNICKI VJESNIK-TECHNICAL GAZETTE, 2021, 28 (01): : 321 - 327
- [6] Evaluation of organic contamination in cleanroom and deposition onto wafer surface INSTITUTE OF ENVIRONMENTAL SCIENCES AND TECHNOLOGY, 1998 PROCEEDINGS - CONTAMINATION CONTROL, 1998, : 556 - 561
- [7] ZEOLITE ADSORBERS FOR MOLECULAR CONTAMINATION CONTROL IN SPACECRAFT OPTICAL SYSTEM CONTAMINATION: EFFECTS, MEASUREMENTS, AND CONTROL 2010, 2010, 7794
- [8] MSX spacecraft contamination control methodology and results OPTICAL SYSTEMS CONTAMINATION AND DEGRADATION, 1998, 3427 : 4 - 15
- [9] The use of molecular adsorbers for spacecraft contamination control SPACE TECHNOLOGY AND APPLICATIONS INTERNATIONAL FORUM (STAIF-96), PTS 1-3: 1ST CONFERENCE ON COMMERCIAL DEVELOPMENT OF SPACE; 1ST CONFERENCE ON NEXT GENERATION LAUNCH SYSTEMS; 2ND SPACECRAFT THERMAL CONTROL SYMPOSIUM; 13TH SYMPOSIUM ON SPACE NUCLEAR POWER AND PROPULSION - FUTURE SPACE AND EARTH SCIENCE MISSIONS - SPECIAL TOPIC; REMOTE SENSING FOR COMMERCIAL, CIVIL AND SCIENCE APPLICATIONS - SPECIAL TOPIC, 1996, (361): : 815 - 823
- [10] EVALUATION OF PARTICULATE CONTAMINATION FOR UNMANNED SPACECRAFT PRELAUNCH OPERATIONS JOURNAL OF ENVIRONMENTAL SCIENCES, 1975, 18 (01): : 20 - &