IETE Technical Review (Institution of Electronics and Telecommunication Engineers, India: Guest editorial

被引：0

作者：

Verma, Ajit K. ^{[1
]}

Srividya, A. ^{[1
]}

机构：

[1] Reliability Engineering Group, Department of Electrical Engineering, Indian Inst. of Technology Bombay, Powai, Mumbai 400 076, India

来源：

IETE Technical Review (Institution of Electronics and Telecommunication Engineers, India) | 2001年 / 18卷 / 01期

关键词：

D O I：

10.1080/02564602.2001.11416934

中图分类号：

学科分类号：

摘要：

引用

页码：2 / 4

共 28 条

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