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- [6] Measurement of transparent film using vertical scanning white-light interferometry 4th International Symposium on Instrumentation Science and Technology (ISIST' 2006), 2006, 48 : 1063 - 1067
- [9] Continuous wavelet transform for micro-component profile measurement using vertical scanning interferometry OPTICS AND LASER TECHNOLOGY, 2008, 40 (07): : 920 - 929