The second IEEE international workshop on software test automation: STA 2010

被引：0

作者：

Belli, Fevzi ^{[1
]}

Subramanyan, Rajesh ^{[2
]}

机构：

[1] Paderborn University, Germany

[2] Siemens Corporate Research, United States

来源：

Proceedings - International Computer Software and Applications Conference | 2010年

关键词：

D O I：

10.1109/COMPSACW.2010.93

中图分类号：

学科分类号：

摘要：

引用

页码：32 / 33

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