Topology of technology graphs: Small world patterns in electronic circuits

被引：118
|
作者：
Ferrer i Cancho, R. [1 ]
Janssen, C. [1 ]
Solé, R.V. [1 ]
机构：
[1] Complex Systems Research Group, FEC, UPC, Campus Nord, B4-B5, Barcelona 08034, Spain
来源：
Physical Review E - Statistical, Nonlinear, and Soft Matter Physics | 2001年 / 64卷 / 4 II期
关键词：
D O I：
10.1103/PhysRevE.64.046119
中图分类号：
学科分类号：
摘要：
29
引用
收藏
页码：461191 / 461195
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