Evokex at the SBFT 2024 Tool Competition

被引：0
|
作者：
Sadykov, Rustam [1 ]
Abdullin, Azat [2 ]
Akhin, Marat [2 ]
机构：
[1] JetBrains Research, Munich, Germany
[2] JetBrains Research, Amsterdam, Netherlands
来源：
Proceedings - 2024 IEEE/ACM International Workshop on Search-Based and Fuzz Testing, SBFT 2024 |
关键词：
1106.1.1 - 1106.5 - 709 Electrical Engineering; General;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Automatic test pattern generation
引用
收藏
页码：67 / 68
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