Transmission-line pulse ESD testing of ICs: A new beginning

被引：0
|
作者：
机构：
[1] Henry, L.G.
[2] Barth, J.
[3] Verhaege, K.
[4] Richner, J.
来源：
Henry, L.G. (leogesd@pacbell.net) | 2001年 / Geological Society of Norway卷 / 18期
关键词：
Current voltage characteristics - Electric discharges - Electric equipment protection - Electric impedance - Electric lines - Electrostatics - Integrated circuit layout - Leakage currents - MOS devices - Simulators;
D O I：
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中图分类号：
学科分类号：
摘要：
An improved transmission-line pulse (TLP) measurement technique is presented. The technique accurately tracks the leakage current evolution in the device. This tracking is in addition to the traditional current and voltage measurements of the device under test (DUT).
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