Synchrotron radiation x-ray topography and defect selective etching analysis of threading dislocations in GaN

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[1] Sintonen, Sakari
[2] Rudzin´ski, Mariusz
[3] Suihkonen, Sami
[4] Jussila, Henri
[5] Knetzger, Michael
[6] Meissner, Elke
[7] Danilewsky, Andreas
[8] Tuomi, Turkka O.
[9] Lipsanen, Harri
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| 1600年 / American Institute of Physics Inc.卷 / 116期
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