SMART: A system-level manufacturing and automation research testbed

被引:20
|
作者
Kovalenko I. [1 ]
Saez M. [1 ]
Barton K. [1 ]
Tilbury D. [1 ]
机构
[1] Mechanical Engineering Dept., Univ. of Michigan, Ann Arbor, 48109, MI
来源
Kovalenko, Ilya (ikoval@umich.edu) | 2017年 / ASTM International卷 / 01期
关键词
Manufacturing automation; Manufacturing systems; Simulations; System-level testbeds;
D O I
10.1520/SSMS20170006
中图分类号
学科分类号
摘要
Manufacturing testbeds are used to develop, test, and analyze technologies that address some of the current challenges facing the manufacturing sector. This paper provided a classification of manufacturing testbeds and categorized several existing testbeds based on each category specification. In addition, this paper introduced the System-level Manufacturing and Automation Research Testbed (SMART), a multidisciplinary testbed used for manufacturing research and education at the University of Michigan. SMART consists of a physical serial-parallel line equipped with sensors to collect data at both the machine and system level. Various tools were used to aggregate, analyze, and display this data in a cloud infrastructure. The system setup allowed for the discovery, testing, implementation, and analysis of new technologies. In addition, different simulations of SMART were developed to augment and study the testbed at the machine and system levels. A number of ongoing projects utilize SMART's physical and virtual capabilities. These projects cover a wide variety of areas, including centralized and decentralized control of manufacturing systems and performance monitoring and analysis. Copyright © 2017 by ASTM International, 100 Barr Harbor Drive, P.O. Box C700, West Conshohocken, PA 19428-2959
引用
收藏
页码:232 / 261
页数:29
相关论文
共 50 条
  • [1] Sensor Data based System-level Anomaly Prediction for Smart Manufacturing
    Wang, Jianwu
    Liu, Chen
    Zhu, Meiling
    Guo, Pei
    Hu, Yapeng
    2018 IEEE INTERNATIONAL CONGRESS ON BIG DATA (IEEE BIGDATA CONGRESS), 2018, : 158 - 165
  • [2] Omnifactory: A National Training and Research Testbed for Smart Manufacturing Systems
    Sanderson, David
    Wang, Zi
    Bainbridge, David
    Ratchev, Svetan
    LEARNING FACTORIES OF THE FUTURE, VOL 2, CLF 2024, 2024, 1060 : 321 - 328
  • [3] System-level Thinking as Key to Construction Site Automation
    Schoeberl, Maximilian
    Fischer, Anne
    Fottner, Johannes
    18TH ANNUAL IEEE INTERNATIONAL SYSTEMS CONFERENCE, SYSCON 2024, 2024,
  • [4] Special issue on semiconductor factory automation - Part 1: System-level automation
    Jeng, MD
    Zhou, MC
    Chen, TWY
    IEEE ROBOTICS & AUTOMATION MAGAZINE, 2004, 11 (01) : 3 - 3
  • [5] System-level design automation tools for digital microfluidic biochips
    Chakrabarty, K
    Su, F
    2005 INTERNATIONAL CONFERENCE ON HARDWARE/SOFTWARE CODESIGN AND SYSTEM SYNTHESIS, 2005, : 201 - 206
  • [6] System-Level Performance of an Automation Solution Based on Industry Standards
    Ballarino, Andrea
    Brusaferri, Alessandro
    Cereia, Marco
    Bertolotti, Ivan Cibrario
    Durante, Luca
    Hu, Tingting
    Leo, Egidio
    Nicolosi, Leonardo
    Seno, Lucia
    Spinelli, Stefano
    Tramarin, Federico
    Valenzano, Adriano
    Vitturi, Stefano
    2014 IEEE EMERGING TECHNOLOGY AND FACTORY AUTOMATION (ETFA), 2014,
  • [7] HyperspaceFlow: A System-Level Design Methodology for Smart Space
    Zeng, Jing
    Yang, Laurence T.
    Ma, Jianhua
    Guo, Minyi
    IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING, 2016, 4 (04) : 568 - 583
  • [8] Verifying System-Level Security of a Smart Ballot Box
    Dghaym, Dana
    Hoang, Thai Son
    Butler, Michael
    Hu, Runshan
    Aniello, Leonardo
    Sassone, Vladimiro
    RIGOROUS STATE-BASED METHODS, ABZ 2021, 2021, 12709 : 34 - 49
  • [9] A system-level approach for the design of smart sensor interfaces
    Chao, G
    Li, XJ
    Meijer, GCM
    PROCEEDINGS OF THE IEEE SENSORS 2004, VOLS 1-3, 2004, : 210 - 214
  • [10] Research of design for system-level testability and system partition
    Li, TG
    Huang, KL
    Lian, GY
    Wang, BL
    ICEMI 2005: Conference Proceedings of the Seventh International Conference on Electronic Measurement & Instruments, Vol 1, 2005, : 242 - 245