Research on low-frequency noise and relability characterization of triple-junction solar cells

被引：0
|
作者：
Yu Y. [1 ]
Sun Y. [1 ]
Wang X. [1 ]
Luo H. [1 ]
Luo J. [1 ]
Xiao W. [2 ]
机构：
[1] The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, Guangzhou
[2] 701 Factory of PLA Navy, Beijing
来源：
Taiyangneng Xuebao/Acta Energiae Solaris Sinica | 2022年 / 43卷 / 02期
关键词：
Bias current; High temperature thermal stress; Noise; Reliability; Solar cells; Triple-junction;
D O I：
10.19912/j.0254-0096.tynxb.2020-0052
中图分类号：
学科分类号：
摘要：
Low-frequency noise characteristic of GaInP/InGaAs/Ge triple-junction solar cells is studied through high temperature stress test and noise test under a wide range of bias current. Experimental results demonstrate that the noise types observed in triple-junction solar cells are 1/f noise and G-R noise. The noise firstly increases to the maximum value and then decreases with the bias current. The typical G-R noise is observed at 500 Hz. After high temperature stress test of triple-junction solar cells, the noise magnitude increases evidently at the lower bias current, which could be attributed to device defects induced by thermal stress. And the dark I-V characteristic of solar cells exhibits consistent performance. Compared with single frequency noise parameters, wideband noise is more sensitive and accurate in indicating solar cells reliability. © 2022, Solar Energy Periodical Office Co., Ltd. All right reserved.
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页码：163 / 168
页数：5
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