Investigation of nanoscale electronic properties of CdZnTe crystals by scanning spreading resistance microscopy

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作者：
Department of Electrical Engineering, University of South Carolina, Columbia, SC 29208, United States [1 ]
不详 [2 ]
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来源：
Semicond Sci Technol | / 4卷
关键词：
Compilation and indexing terms; Copyright 2024 Elsevier Inc;
D O I：
045012
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学科分类号：
摘要：
Thermionic emission - Z transforms - Cadmium alloys - Doping (additives) - II-VI semiconductors - Electronic properties - Semiconductor alloys
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