Fragment ion distribution in charge-changing collisions of 2-MeV Si ions with C60

被引：0
|
作者：
Itoh, A. [1 ]
Tsuchida, H. [1 ]
Miyabe, K. [1 ]
Majima, T. [1 ]
Nakai, Y. [1 ]
机构：
[1] Quantum Science and Engineering Ctr., Kyoto University, Kyoto 606-8501, Japan
来源：
Physical Review A. Atomic, Molecular, and Optical Physics | 2001年 / 64卷 / 03期
关键词：
Charge-changing collisions - Degree of multiple ionization - Electron loss collision - Electronic energy deposition - Fragment ion distribution - Time of flight coincidence;
D O I：
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摘要：
(Edited Abstract)
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页码：1 / 032702
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