Spontaneous infralow-frequency generation observed in the current noise of a back-biased stabilitron

被引：0
|
作者：
Katarzhnov, Yu.D. [1 ]
Nedopekin, V.G. [1 ]
Rogov, V.I. [1 ]
Sukhorukov, S.T. [1 ]
机构：
[1] Inst. of Theor. Experim. Phys., ul. Bol'shaya Cheremushkinskaya 25, Moscow, 117259, Russia
来源：
Radiotekhnika i Elektronika | 2002年 / 47卷 / 12期
关键词：
Infralow-frequency generation - Stabilitron;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：1509 / 1512
相关论文
共 20 条
  • [1] Spontaneous infralow-frequency generation observed in the current noise of a back-biased stabilitron
    Katarzhnov, YD
    Nedopekin, VG
    Rogov, VI
    Sukhorukov, ST
    JOURNAL OF COMMUNICATIONS TECHNOLOGY AND ELECTRONICS, 2002, 47 (12) : 1379 - 1382
  • [2] INFRALOW-FREQUENCY NOISE GENERATOR
    GLADKIKH, GA
    PANOV, VG
    PAKHOMOV, IP
    CHICHIK, PD
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR, 1971, 14 (03): : 797 - &
  • [3] INFRALOW-FREQUENCY OSCILLATIONS OF CURRENT IN INP
    KOVALEVSKAYA, GG
    ALYUSHINA, VI
    SLOBODCHIKOV, SV
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1973, 7 (01): : 126 - 127
  • [4] INFRALOW-FREQUENCY GENERATORS OF TRIANGULAR CURRENT PULSES
    DANILOV, VI
    POPOV, AA
    KHABAROV, VS
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1981, 24 (04) : 975 - 978
  • [5] Shot noise in back-biased step junctions with exponential carrier generation rate
    Sasaki, Kazuhiro
    Sato, Kazunori
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1991, 30 (01): : 31 - 32
  • [6] SHOT NOISE IN BACK-BIASED STEP JUNCTIONS WITH EXPONENTIAL CARRIER GENERATION RATE
    SASAKI, K
    SATO, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1991, 30 (01): : 31 - 32
  • [7] Non-exotic theory of 1/f noise as a trace of infralow-frequency fluctuations
    Shul'man, AY
    Unsolved Problems of Noise and Fluctuations, 2005, 800 : 98 - 106
  • [8] Electrical Characterization of Random Telegraph Noise in Back-Biased Ultrathin Silicon-On-Insulator MOSFETs
    Marquez, Carlos
    Rodriguez, Noel
    Gamiz, Francisco
    Ohata, Akiko
    2016 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS 2016), 2016, : 40 - 43
  • [9] ANALYSIS OF PARAMETRIC ACTION IN BACK-BIASED P-N JUNCTIONS CARRYING INJECTED CURRENT
    STERZER, F
    RCA REVIEW, 1966, 27 (04): : 500 - &
  • [10] Character of the dissolution and partial electrode processes at the alternating-current infralow-frequency polarization of brasses in chloride media. II. Cu44Zn β-brass
    I. K. Marshakov
    O. Yu. Kuksina
    V. Yu. Kondrashin
    Protection of Metals, 2007, 43 : 334 - 339
12