Fault diagnosis for analog circuits with tolerance base on ciucuit feature information matrix

被引：0
|
作者：
Wei Z. [1 ]
Chen S. [1 ]
Zhou X. [1 ]
机构：
[1] Department of Control Engineering, Academy of Armored Force Engineering, Beijing
来源：
Harbin Gongcheng Daxue Xuebao/Journal of Harbin Engineering University | 2016年 / 37卷 / 09期
关键词：
Analog circuit; Blur degree; Circuit feature information matrix; Discrete degree; Fault diagnosis; Weighted Mahalanobis distance;
D O I：
10.11990/jheu.201602014
中图分类号：
学科分类号：
摘要：
In this paper, we propose a soft fault diagnostic method for analog circuits based on a circuit feature information matrix, which we developed with respect to the response characteristics of different excitation levels at different test points. We used the weighted Mahalanobis distance to characterize the degree of similarity of each faulty feature vector. By comparing the weighted Mahalanobis distance matrixes of fault-free and faulty circuits, we were able to construct the circuit feature information similarity matrix. Using this matrix, we can obtain the integrated similarity vector of each circuit's fault mode by considering the dispersion and fuzzy weighting factors. Finally, we determine the circuit's fault mode based on the judgment criteria of the circuit fault. To reduce the diagnostic workload and improve diagnostic efficiency, we based the data sampling, analysis, and processing of the diagnostic procedures on related software. The simulation experiment results show that our proposed method is applicable not only to catastrophic faults but also to parametric faults in the tolerance circuits, and that it has higher detection accuracy compared to methods with only a single-fault feature. © 2016, Harbin Institute of Technology. All right reserved.
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页码：1256 / 1260
页数：4
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