Investigation of bonding in nano-SiO2 by Si L2,3 X-ray absorption near-edge structure spectroscopy

被引:0
|
作者
Wu, Z.Y. [1 ]
Ibrahim, K. [1 ]
Li, G. [1 ]
Zhang, J. [1 ]
Liu, F.Q. [1 ]
Abbas, M.I. [1 ]
Hu, R. [1 ]
Qian, H.J. [1 ]
Tang, F.Q. [1 ]
机构
[1] Inst. of High Energy Phys., Chinese Acad. of Sci., Beijing 100039, China
关键词
Absorption - Bonding - Silica - Silicon - Spectroscopy - X rays;
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摘要
The Si L2,3 X-ray absorption near-edge structure (XANES) can be used to probe the local structure around Si and derive electronic information of the unoccupied s- and d-like partial density of states in nano-size SiO2. We present Si L2,3-edge for three different size silicates acquired by total electron yield (TEY) at the photoemission station of Beijing Synchrotron Radiation Facility (BSRF). The Si L2,3-edge spectra are interpreted based on ab initio full multiple-scattering (MS) calculation. The Si L2,3-edge of nano-size materials has XANES similar to that of α-quartz. The similarities between the Si L2,3-edge shapes attest to a common molecular-orbital picture of their Si-O bonding and the same coordination state. However, a considerable broadening of Si L2,3-edge XANES spectra as decrease of particle size is also an indicative of polyhedral distortions.
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页码:473 / 478
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