Preparation and characterization of graphene and few-layer graphene

被引:0
|
作者
Feng, Ying [1 ]
Huang, Shi-Hua [1 ]
Kang, Kai [1 ]
Duan, Xiao-Xia [1 ]
机构
[1] Beijing Jiaotong University, Institute of Optoelectrical Technology, Beijing 100044, China
来源
关键词
Atomic force microscopy - Chemical vapor deposition - Microscopes - Pyrolytic graphite - Silica - Silicon oxides;
D O I
暂无
中图分类号
学科分类号
摘要
Few-layer graphene was prepared from highly oriented pyrolytic graphite by micromechanical cleavage and transferred to the silicaon coated with silicon dioxide (SiO2/Si). The thickness of graphene on the SiO2/Si support was investigated by color and contrast variations under an optical microscope. Atomic force microscopy and Raman spectroscopy were used to determine the number of layers. Results show that a monolayer, double layers and multiple layers of graphene were prepared. The optical microscope images can give a satisfactory identification of the graphene thickness on SiO2/Si. In the Raman spectrum the 2D band is narrower and G band is weaker for double layers than that for multiple layers. Chemical vapor deposition was also used to grow large area (~cm2) graphene. However, micromechanical cleavage is a more simple method to prepare graphene.
引用
收藏
页码:26 / 30
相关论文
共 50 条
  • [1] Preparation and characterization of graphene and few-layer graphene
    Feng Ying
    Huang Shi-hua
    Kang Kai
    Duan Xiao-xia
    NEW CARBON MATERIALS, 2011, 26 (01) : 26 - 30
  • [2] Fabrication and characterization of few-layer graphene
    Zhang, Hongxin
    Feng, Peter X.
    CARBON, 2010, 48 (02) : 359 - 364
  • [3] Preparation and capacitance performance of few-layer graphene
    Wu Y.
    Bao W.
    Xie Y.
    Yao C.
    Mater. Res. Innov., 2022, 6 (382-388): : 382 - 388
  • [4] Catalytic Nanopatterning of Few-Layer Graphene
    Melinte, Georgian
    Moldovan, Simona
    Hirlimann, Charles
    Baaziz, Walid
    Begin-Colin, Sylvie
    Cuong Pham-Huu
    Ersen, Ovidiu
    ACS CATALYSIS, 2017, 7 (09): : 5941 - 5949
  • [5] Spectroscopic ellipsometry of few-layer graphene
    Isic, Goran
    Jakovljevic, Milka
    Filipovic, Marko
    Jovanovic, Djordje
    Vasic, Borislav
    Lazovic, Sasa
    Puac, Nevena
    Petrovic, Zoran Lj.
    Kostic, Radmila
    Gajic, Rados
    Humlicek, Jozef
    Losurdo, Maria
    Bruno, Giovanni
    Bergmair, Iris
    Hingerl, Kurt
    JOURNAL OF NANOPHOTONICS, 2011, 5
  • [6] Silicene Passivation by Few-Layer Graphene
    Ritter, Viktoria
    Genser, Jakob
    Nazzari, Daniele
    Bethge, Ole
    Bertagnolli, Emmerich
    Lugstein, Alois
    ACS APPLIED MATERIALS & INTERFACES, 2019, 11 (13) : 12745 - 12751
  • [7] The work function of few-layer graphene
    Leenaerts, O.
    Partoens, B.
    Peeters, F. M.
    Volodin, A.
    Van Haesendonck, C.
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2017, 29 (03)
  • [8] Crystallographic etching of few-layer graphene
    Datta, Sujit S.
    Strachan, Douglas R.
    Khamis, Samuel M.
    Johnson, A. T. Charlie
    NANO LETTERS, 2008, 8 (07) : 1912 - 1915
  • [9] Magnetospectroscopy of epitaxial few-layer graphene
    Sadowski, M. L.
    Martinez, G.
    Potemski, M.
    Berger, C.
    de Heer, W. A.
    SOLID STATE COMMUNICATIONS, 2007, 143 (1-2) : 123 - 125
  • [10] Parity Effects in Few-Layer Graphene
    Goto, Hidenori
    Uesugi, Eri
    Eguchi, Ritsuko
    Kubozono, Yoshihiro
    NANO LETTERS, 2013, 13 (11) : 5153 - 5158