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- [1] Dynamic testing of a scanning probe CMM PRECISION ENGINEERING, NANOTECHNOLOGY, VOL. 2, 1999, : 312 - 315
- [4] CMM scanning probe for submicron measurements MANUFACTURING ENGINEERING, 2003, 130 (06): : 40 - +
- [7] Dynamic error characterization of a scanning probe CMM PROCEEDINGS OF THE THIRTEENTH ANNUAL MEETING OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 1998, : 571 - 574
- [8] Continuous-scanning CMM gives accuracy edge MANUFACTURING ENGINEERING, 1996, 117 (04): : 90 - 92
- [9] CMM Inspection Combining Tactile Probing and Laser Scanning 10TH IMEKO SYMPOSIUM: LASER METROLOGY FOR PRECISION MEASUREMENT AND INSPECTION IN INDUSTRY (LMPMI) 2011, 2011, 2156 : 259 - 264