共 23 条
- [1] SHENG Kuang, GUO Qing, ZHANG Junming, Et al., Development and prospect of SiC power devices in power grid, Proceedings of the CSEE, 32, 30, pp. 1-7, (2012)
- [2] LI Zongjian, WANG Jun, YU Jiajun, Et al., Application of SiC JMOS and SiC DMOS in Si/SiC hybrid switch based single-phase inverter, Proceedings of the CSEE, 39, 19, pp. 5674-5682, (2019)
- [3] SHENG Kuang, REN Na, XU Hongyi, A recent review on silicon carbide power devices technologies, Proceedings of the CSEE, 40, 6, pp. 1741-1752, (2020)
- [4] WANG Lina, DENG Jie, YANG Junyi, Et al., Junction temperature extraction methods for Si and SiC power devices: a review and possible alternatives, Transactions of China Electrotechnical Society, 34, 7, pp. 703-716, (2019)
- [5] ZHANG Qinghao, ZHANG Pinjia, A novel on-line method for monitoring the junction temperature of SiC MOSFET based on threshold voltage, Proceedings of the CSEE, 40, 18, pp. 5742-5750, (2020)
- [6] CHEN Jie, DENG Erping, ZHAO Zixuan, Et al., Failure mechanism analysis of SiC MOSFET under different aging test methods, Transactions of China Electrotechnical Society, 35, 24, pp. 5105-5114, (2020)
- [7] ZENG Zheng, ZHANG Xin, LI Xiaoling, Layout- dominated dynamic current imbalance in multichip power module: mechanism modeling and comparative evaluation, IEEE Transactions on Power Electronics, 34, 11, pp. 11199-11214, (2019)
- [8] LIU Ping, LI Haipeng, MIAO Yiru, Et al., Low overshoot and low loss active gate driver for SiC MOSFET based on driving current dynamic regulation, Proceedings of the CSEE, 40, 18, pp. 5730-5741, (2020)
- [9] WU Tao, SUN Peng, ZHAO Zhibin, Et al., A review of junction temperature measurement methods of SiC MOSFET by temperature-sensitive electrical parameters, Proceedings of the CSEE, 41, 11, pp. 3904-3914, (2021)
- [10] SUN Peng, ZHAO Zhibin, CAI Yumeng, Et al., Chip screening for parallel silicon carbide MOSFET based on switching energy balancing, Proceedings of the CSEE, 39, 19, pp. 5613-5623, (2019)