Substrate interaction mediated control of phase separation in FIB milled Ag-Cu thin films

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作者：
Department of Materials Science and Metallurgical Engineering, Indian Institute of Technology, Telangana, Hyderabad [1 ]
502284, India
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arXiv | 1600年
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Engineering Village;
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摘要：
Cu thin film - Focused ion beam milling - Focused ions beams - Functional devices - Integral part - Nano-fabrication methods - Optical displays - Phase stable - Single phasis - Substrate interaction
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