Depth-resolved compositional analysis of W/B4C multilayers using resonant soft X-ray reflectivity

被引：0
|
作者：
Rao, P.N. [1 ]
Goutam, U.K. [2 ]
Kumar, Prabhat [3 ]
Gupta, Mukul [3 ]
Ganguli, Tapas [1 ,4 ]
Rai, S.K. [1 ,4 ]
机构：
[1] Synchrotrons Utilization Section, Raja Ramanna Centre for Advanced Technology, Indore,452013, India
[2] Technical Physics Division, Bhabha Atomic Research Center, Trombay, Mumbai,400094, India
[3] UGC-DAE Consortium for Scientific Research, University Campus, Khandwa Road, Indore,452 001, India
[4] Homi Bhabha National Institute, Anushakti Nagar, Mumbai,400094, India
来源：
Journal of Synchrotron Radiation | 2019年 / 26卷
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页码：793 / 800
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