Radiation-induced damage mechanisms and on-orbit degradation predictions for triple-junction solar cells

被引:0
|
作者
Peng C. [1 ]
机构
[1] Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou
来源
关键词
Displacement damage; GaAs; Radiation effects; Solar cells; Space applications; TCAD simulations;
D O I
10.19912/j.0254-0096.tynxb.2021-0733
中图分类号
学科分类号
摘要
Proton/electron irradiation experiments are carried out for triple-junction solar cells. The radiation damage sensitive region in triple-junction solar cell is identified, and the degradation model of electrical characteristics with the displacement damage dose (DDD) is established. Based on TCAD simulations, the degradation mechanisms of triple-junction solar cells after irradiation is studied and verified. Combined with Monte Carlo simulations and ground irradiation tests, the equivalent DDD method is used to predict the on-orbit performances of triple-junction solar cells. The on-orbit degradations of typical Chinese triple-junction solar cells in GEO and LEO orbits are calculated. © 2022, Solar Energy Periodical Office Co., Ltd. All right reserved.
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页码:25 / 31
页数:6
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