A DEEP LEARNING ENSEMBLE APPROACH FOR X-RAY IMAGE CLASSIFICATION

被引:0
|
作者
Esme, Engin [1 ]
Kiran, Mustafa Servet [1 ]
机构
[1] Konya Tech Univ, Engn & Nat Sci Fac, Software Engn Dept, Konya, Turkiye
来源
KONYA JOURNAL OF ENGINEERING SCIENCES | 2024年 / 12卷 / 03期
关键词
Deep Learning; Ensemble Learning; Object Classification; -Ray;
D O I
10.36306/konjes.1424329
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The application of deep learning-based intelligent systems for X-ray imaging in various settings, including transportation, customs inspections, and public security, to identify hidden or prohibited objects are discussed in this study. In busy environments, x-ray inspections face challenges due to time limitations and a lack of qualified personnel. Deep learning algorithms can automate the imaging process, enhancing object detection and improving safety. This study uses a dataset of 5094 x-ray images of laptops with hidden foreign circuits and normal ones, training 11 deep learning algorithms with the 10-fold cross-validation method. The predictions of deep learning models selected based on the 70% threshold value have been combined using a meta-learner. ShuffleNet has the highest individual performance with 83.56%, followed by InceptionV3 at 81.30%, Darknet19 at 78.92%, DenseNet201 at 77.70% and Xception at 71.26%. Combining these models into an ensemble achieved a remarkable classification success rate of 85.97%, exceeding the performance of any individual model. The ensemble learning approach provides a more stable prediction output, reducing standard deviation among folds as well. This research highlights the potential for safer and more effective X-ray inspections through advanced machine learning techniques.
引用
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页数:15
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