Point defects in CdTe and CdTeSe alloy: A first principles investigation with DFT plus U

被引:1
|
作者
Xiang, Xiaofeng [1 ]
Tong, Yijun [2 ]
Gehrke, Aaron [3 ]
Dunham, Scott T. [2 ]
机构
[1] Univ Washington, Mol Engn & Sci Inst, Seattle, WA 98195 USA
[2] Univ Washington, Dept Elect & Comp Engn, Seattle, WA 98195 USA
[3] Univ Washington, Dept Mat Sci Engn, Seattle, WA 98195 USA
来源
PHYSICAL REVIEW MATERIALS | 2024年 / 8卷 / 08期
关键词
CADMIUM VACANCY; LEVEL; IDENTIFICATION; CU2ZNSNS4; SELENIUM;
D O I
10.1103/PhysRevMaterials.8.084602
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
CdTe and its alloy CdSeTe are widely used in optoelectronic devices, such as radiation detectors and solar cells, due to their superior electrical properties. However, the formation of defects and defect complexes in these materials can significantly affect their performance. As a result, understanding the defect formation and recombination processes in CdTe and CdSeTe alloy is of great importance. In recent years, density functional theory (DFT) calculations have emerged as a powerful tool for investigating the properties of defects in semiconductors. In this paper, we use DFT+U calculations to comprehensively study the properties of intrinsic defects as well as extrinsic defects induced by commonly used dopants, such as Cu and group V elements, in CdTe and CdSeTe alloy. This work provides insights into the effects of these defects on the electrical and optical properties of the material.
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页数:14
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