Effective Lightweight Software Fault Localization Combined with Fault Context and Test Suite Optimization

被引:0
|
作者
Saxena, Amol [1 ]
Bhatnagar, Roheet [1 ]
Srivastava, Devesh Kumar [2 ]
机构
[1] Manipal Univ Jaipur, Comp Sci & Engn Dept, SCSE, Jaipur 303007, Rajasthan, India
[2] Manipal Univ Jaipur, Dept Informat Technol, SIT, Jaipur 303007, Rajasthan, India
关键词
fault context; program spectrum; spectrum- based fault localization; statement execution frequency; suspiciousness; testing and debugging; test suite optimization; PROGRAM;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
locating software faults during debugging is crucial yet challenging. Automated techniques, such as spectrum -based fault localization (SBFL), aid developers in efficiently localizing faults by analyzing program execution information and utilizing statistical approaches to rank program entities according to their suspiciousness. SBFL is also known as lightweight fault localization because of its scalability and minimal computational overhead. While essential, there has been limited research on how test suites affect fault localization. In this paper, we show how test suites impact fault localization and how they can be optimized for better results. SBFL techniques have some inherent limitations, especially in diagnosing faults within loop bodies or iteration statements. Additionally, identical suspiciousness levels can result in ties. While SBFL techniques effectively rank faulty program entities among the Top -N suspicious entities, they might not consistently position the faulty entity within the initial few positions. To address these research gaps, this paper proposes a hybrid approach that combines test suite optimization, statement execution frequency, and fault context concepts to enhance the performance of existing SBFL techniques in single fault scenarios. We evaluate our approach using three popular SBFL methods (Ochiai, Jaccard, and DStar) on Siemens benchmarks and four large real -world programs (flex, grep, sed, and space) with their test suites. The results demonstrate a significant enhancement in fault localization performance when applying our proposed approach to existing SBFL methods. For example, when applied to Ochiai, it reduces examined statements by 62.76% and 65.23% on average for the two test suites, respectively. Furthermore, it identifies 52% of faults by examining only 1% or less of the code and locates 60% of faults by analyzing only 0.1% or less of the code in Siemens and four large real -world programs, respectively. Similar improvements are observed when our approach is applied to Jaccard and DStar methods on the same test suites. We also show that our results are statistically significant, validating that our approach substantially improves the performance of existing SBFL techniques.
引用
收藏
页码:835 / 870
页数:36
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