Application of Michelson interferometer in phase coherent imaging measurement system

被引:0
|
作者
Sha J. [1 ]
Yang J. [2 ]
Fan J. [1 ]
Wang J. [1 ]
机构
[1] School of Physical Science and Technology, Suzhou University of Science and Technology, Suzhou
[2] School of Physical Science and Technology, Soochow University, Suzhou
关键词
laser; Michelson interferometer; near top-hat beams; phase object; refractive index;
D O I
10.3788/IRLA20220396
中图分类号
学科分类号
摘要
In the conventional 4f phase coherent imaging measurement technology, phase objects were used to convert the phase change generated by the measured material into a directly observable amplitude change to achieve the measurement of the nonlinear refractive index of the material. However, the thickness of the phase object was fixed, and the phase delay changes with the laser wavelength, and a suitable phase object needs to be replaced in the measurement. The influence of different laser wavelength on the phase shift of the phase object was theoretically analyzed, and the influence of the radius of the phase object and the phase shift on the sensitivity of the 4f phase coherent imaging system was discussed in detail. A phase-adjustable phase object was realized by using the phase delay of two beams in Michelson interferometer instead of the conventional phase object. Because the phase delay of the two beams of Michelson interferometer was continuously adjustable, it makes the sensitivity of measurement at different shapes and different wavelengths of laser optimal. This method further improves the 4f phase coherent imaging measurement technology, not only solves the deficiencies of the conventional phase object, but also improves the accuracy of the measurement. © 2022 Chinese Society of Astronautics. All rights reserved.
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