Combining laser-induced fluorescence and light-scattering microscopies to diagnose low-fluence damage precursors on KDP-based crystal surface

被引:0
|
作者
Deng, Qinghua [1 ]
Sun, Laixi [1 ]
Huang, Jin [1 ]
Wang, Fengrui [1 ]
Zhou, Xiaoyan [1 ]
Ye, Xin [1 ]
Xia, Handing [1 ]
Shi, Zhaohua [1 ]
Shao, Ting [1 ]
Li, Weihua [1 ]
Li, Bo [1 ]
Zheng, Wanguo [1 ]
机构
[1] China Acad Engn Phys, Res Ctr Laser Fus, Mianyang, Sichuan, Peoples R China
基金
中国国家自然科学基金;
关键词
lase damage; fluorescence microscopy; nonlinear optical materials; DEFECTS; SILICA; IRRADIATION;
D O I
10.1117/1.OE.63.2.025107
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
. The maximal output fluence of high-power laser systems remains limited by KH2PO4 (KDP)-based optical components used to convert the infrared pulses to 3 omega pulses. The correlation between optical defects (scales of a few micrometers) on KDP crystal surfaces and damage initiation was systematically investigated by combining laser-induced fluorescence (FL) and light-scattering microscopies incorporated an in-situ damage testing facility (wavelength at 355 nm and pulse width of 7 ns). We demonstrated that the surface defects featuring both FL and light-scattering have a high propensity to damage. The scattering feature of the FL precursors was found to be a key factor for damage initiation, whose physical mechanism was thoroughly revealed. The results further implied that the removal of such damage precursors can greatly improve the damage resistance of KDP-based crystals. Considering that this combined imaging technique is noninvasive, the results establish this methodology as an attractive and non-destructive tool for evaluating and improving the surface damage performance of KDP-based crystals used in high-power lasers.
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页数:7
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