Role of image feature enhancement in intelligent fault diagnosis for mechanical equipment: A review

被引：0
|
作者：
Sun, Yongjian [1 ]
Wang, Wei [1 ]
机构：
[1] School of Electrical Engineering, University of Jinan, Jinan, Shandong, China
来源：
Engineering Failure Analysis | 2024年 / 156卷
关键词：
Compendex;
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学科分类号：
摘要：
Failure analysis
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