A novel extraction method of device parameters for thin-film transistors (TFTs)

被引：0
|
作者：
Bai, Ziheng [1 ,2 ]
Lu, Nianduan [2 ]
Wang, Jiawei [2 ]
Geng, Ding [2 ]
Liu, Dongyang [2 ]
Xiao, Kui [1 ]
Li, Ling [2 ]
机构：
[1] National Materials Corrosion and Protection Data Center, University of Science and Technology Beijing, Beijing,100083, China
[2] Key Laboratory of Microelectronic Devices and Integrated Technology, Institute of Microelectronics of Chinese Academy of Sciences, Beijing,100029, China
来源：
Physics Letters, Section A: General, Atomic and Solid State Physics | 2021年 / 403卷
基金：
中国国家自然科学基金;
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