Visual inspection by deep learning and machine learning

被引：0
|
作者：
Nagata T. [1 ]
Hashimoto D. [1 ]
机构：
[1] Information and Communication Research Division, Mizuho Information & Research Institute, Inc., 2-3, Kanda-Nishikicho, Chiyoda-ku, Tokyo
来源：
Journal of Japan Institute of Electronics Packaging | 2020年 / 23卷 / 04期
关键词：
D O I：
10.5104/jiep.23.271
中图分类号：
学科分类号：
摘要：
[No abstract available]
引用
收藏
页码：271 / 274
页数：3
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