Measuring temperature in gan hemts: An approach based on raman spectroscopy

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作者：
Boudart, Bertrand [1 ]
Guhel, Yannick [1 ]
机构：
[1] Groupe de Recherche en Informatique, Image, Automatique et Instrumentation de Caen, Normandie Université, UNICAEN, ENSICAEN, CNRS, GREYC, France
来源：
Electronic Device Failure Analysis | 2019年 / 21卷 / 02期
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摘要：
18
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页码：10 / 14
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