DUAL-MODE LOGIC FOR FUNCTION-INDEPENDENT FAULT TESTING

被引：0
|
作者：
DASGUPTA, S [1 ]
HARTMANN, CRP [1 ]
RUDOLPH, LD [1 ]
机构：
[1] SYRACUSE UNIV,SCH COMP & INFORMAT SCI,SYRACUSE,NY 13210
来源：
IEEE TRANSACTIONS ON COMPUTERS | 1980年 / 29卷 / 11期
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：1025 / 1029
页数：5
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