3-POINT PROBE HEATING EFFECTS IN SILICON

被引：0

|

作者：

SCHUMANN, PA

HALLENBA.JF

POPONIAK, MR

SCHNEIDE.CP

机构：

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1969年 / 116卷 / 01期

关键词：

D O I：

10.1149/1.2411713

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

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页码：106 / &

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