PROBABILITY OF ERROR AND EXPECTED BHATTACHARYYA DISTANCE IN MULTICLASS PATTERN-RECOGNITION

被引：5

|

作者：

BABU, CC ^{[1
]}

机构：

[1] UNIV CALIF,SCH ENGN,IRVINE,CA 92664

来源：

PROCEEDINGS OF THE IEEE | 1972年 / 60卷 / 11期

关键词：

D O I：

10.1109/PROC.1972.8928

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：1451 / 1452

页数：2

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