EXAMINATION OF PAINT CHIPS AND SCRAPINGS WITH THE SPECTROPHOTOMETER

被引：0

作者：

Williams, John F.

机构：

来源：

JOURNAL OF CRIMINAL LAW CRIMINOLOGY AND POLICE STUDIES | 1954年 / 44卷 / 05期

关键词：

D O I：

10.2307/1139635

中图分类号：

D9 [法律]; DF [法律];

学科分类号：

0301 ;

摘要：

引用

页码：647 / 651

页数：5

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