CHARACTERIZATION OF CDTE POLYCRYSTALLINE FILMS BY X-RAY PHOTOELECTRON AND AUGER SPECTROSCOPIES

被引：10
|
作者：
ZELAYA, O
SANCHEZSINENCIO, F
GONZALEZHERNANDEZ, J
PENA, JL
FARIAS, MH
COTAARAIZA, L
HIRATA, GA
RABAGO, F
机构：
[1] INST POLITECN NACL,CTR INVEST & ESTUDIOS AVANZADOS,UNIDAD MERIDA,MERIDA 97310,YUCATAN,MEXICO
[2] UNIV NACL AUTONOMA MEXICO,INST FIS,ENSENADA LAB,ENSENADA 22800,MEXICO
[3] UNIV AUTONOM SAN LUIS POTOSI,INST FIS,SAN LUIS POTOSI,SAN LUIS POTOSI,MEXICO
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1989年 / 7卷 / 02期
关键词：
D O I：
10.1116/1.576126
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：245 / 248
页数：4
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