SMALL-ANGLE X-RAY-DIFFRACTION STUDIES ON INTERFACE SHARPNESS OF AMORPHOUS SE/CDSE SUPERLATTICES

X-ray diffraction measurements have been performed to evaluate the interface sharpness of Se/CdSe amorphous multilayers as well as their thermal stability. A value of about 1.6 nm has been measured as the effective interface thickness, d(i). It decreased to d(i) approximate to 1.3 nm after the samples were annealed at an optimum temperature, T-a approximate to 360 K. A negative interdiffusion coefficient has been obtained in this case. More complicated temperature dependences of the X-ray diffraction peaks have been observed at higher annealing temperatures. Two different thermally dependent processes have been considered.