SECONDARY-ION COLLECTION SYSTEM FOR AN ION MICROPROBE ANALYZER OF HIGH MASS RESOLUTION

被引：8

|

作者：

KROHN, VE

RINGO, GR

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1972年 / 43卷 / 12期

关键词：

D O I：

10.1063/1.1685560

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

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页码：1771 / &

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