EFFECT OF X-RAY-IRRADIATION ON MOS CAPACITORS

被引：0
|
作者：
SINGH, RJ
SRIVASTAVA, RS
机构：
来源：
RADIATION EFFECTS AND DEFECTS IN SOLIDS | 1982年 / 60卷 / 1-4期
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暂无
中图分类号：
TL [原子能技术]; O571 [原子核物理学];
学科分类号：
0827 ; 082701 ;
摘要：
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页码：161 / 166
页数：6
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