A LOW TEMPERATURE SINGLE CRYSTAL X-RAY DIFFRACTION TECHNIQUE

被引：41
|
作者：
KAUFMAN, HS
FANKUCHEN, I
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1949年 / 20卷 / 10期
关键词：
D O I：
10.1063/1.1741367
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：733 / 734
页数：2
相关论文
共 50 条
  • [1] Low temperature single crystal X-ray diffraction: advantages, instrumentation and applications
    Goeta, AE
    Howard, JAK
    CHEMICAL SOCIETY REVIEWS, 2004, 33 (08) : 490 - 500
  • [2] Low temperature redetermination of the Glycine sodium nitrate structure by using X-ray single crystal diffraction technique
    Nichol, G. S.
    Paredes, J. Hernandez
    Poncce, H. E. Esparza
    Beltran, M. Pacheco
    Ramos, M. E. Alvarez
    Duarte-Moller, A.
    REVISTA MEXICANA DE FISICA, 2008, 54 (01) : 13 - 16
  • [3] A new single-crystal mounting technique for low-background high-temperature X-ray diffraction
    Schreuer, J
    Baumgarte, A
    Steurer, W
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1997, 30 : 1162 - 1164
  • [4] New single-crystal mounting technique for low-background high-temperature X-ray diffraction
    Schreuer, J.
    Baumgarte, A.
    Steurer, W.
    Journal of Applied Crystallography, 1997, 30 (pt 6):
  • [5] High temperature single crystal X-ray diffraction of Pd bismuthides
    Karimova, O., V
    Mezhueva, A. A.
    Zolotarev, A. A.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2024, 80
  • [6] Crystal chemistry and low-temperature behavior of datolite: A single-crystal X-ray diffraction study
    Rinaldi, Romano
    Gatta, G. Diego
    Angel, Ross J.
    AMERICAN MINERALOGIST, 2010, 95 (10) : 1413 - 1421
  • [7] SINGLE-CRYSTAL X-RAY DIFFRACTION
    Gurzhiy, Vladislav V.
    ADVANCED MATERIALS & PROCESSES, 2020, 178 (01): : 32 - 34
  • [8] Determination of structure and polarity of SiC single crystal by X-ray diffraction technique
    Zheng, X.H.
    Qu, B.
    Wang, Y.T.
    Yang, H.
    Liang, J.W.
    Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 2001, 22 (01): : 35 - 39
  • [9] High pressure single-crystal synchrotron X-ray diffraction technique
    Li Xiao-Dong
    Li Hui
    Li Peng-Shan
    ACTA PHYSICA SINICA, 2017, 66 (03)
  • [10] The low-temperature behaviour of cancrinite: an in situ single-crystal X-ray diffraction study
    Gatta, G. Diego
    Lotti, P.
    Kahlenberg, V.
    Haefeker, U.
    MINERALOGICAL MAGAZINE, 2012, 76 (04) : 933 - 948
12345