SOURCE LIST - STATIC RANDOM-ACCESS MEMORIES

被引：0

作者：

不详

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来源：

ELECTRONIC PRODUCTS MAGAZINE | 1988年 / 30卷 / 16期

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D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：40 / 41

页数：2

共 50 条

[1] RANDOM-ACCESS MEMORIES
CHAMBERLIN, DC
ELECTRONIC PRODUCTS MAGAZINE, 1981, 23 (10): : 45 - &
[2] CODING FOR RANDOM-ACCESS MEMORIES
STIFFLER, JJ
IEEE TRANSACTIONS ON COMPUTERS, 1978, 27 (06) : 526 - 531
[3] SEMICONDUCTOR RANDOM-ACCESS MEMORIES
VADASZ, LL
CHUA, HT
GROVE, AS
IEEE SPECTRUM, 1971, 8 (05) : 40 - +
[4] CRYOGENIC RANDOM-ACCESS MEMORIES
SASS, AR
STEWART, WC
COSENTINO, LS
IEEE SPECTRUM, 1967, 4 (07) : 91 - +
[5] SEMICONDUCTOR RANDOM-ACCESS MEMORIES
ALTMAN, L
ELECTRONICS, 1974, 47 (12): : 108 - 110
[6] A DYNAMIC RECONFIGURATION SCHEME FOR MEGA BIT STATIC RANDOM-ACCESS MEMORIES
RAYAPATI, VN
KAMINSKA, B
MICROELECTRONICS AND RELIABILITY, 1994, 34 (01): : 107 - 114
[7] TECHNOLOGY AND LAYOUT-RELATED TESTING OF STATIC RANDOM-ACCESS MEMORIES
CHAKRABORTY, K
MAZUMDER, P
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1994, 5 (04): : 347 - 365
[8] SEMICONDUCTOR MEMORIES . MOS RANDOM-ACCESS MEMORIES
ROOP, D
ELECTRONIC PRODUCTS MAGAZINE, 1970, 12 (10): : 96 - &
[9] A REALISTIC FAULT MODEL AND TEST ALGORITHMS FOR STATIC RANDOM-ACCESS MEMORIES
DEKKER, R
BEENKER, F
THIJSSEN, L
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1990, 9 (06) : 567 - 572
[10] Technology and layout-related testing of static random-access memories
Chakraborty, Kanad
Mazumder, Pinaki
Journal of Electronic Testing: Theory and Applications (JETTA), 1994, 5 (04): : 347 - 365