A MULTIPURPOSE POLARIMETER FOR X-RAY STUDIES

被引：5

作者：

FINKELSTEIN, KD ^{[1
]}

STAFFA, C ^{[1
]}

SHEN, Q ^{[1
]}

机构：

[1] CORNELL UNIV, DEPT APPL & ENGN PHYS, ITHACA, NY 14853 USA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1994年 / 347卷 / 1-3期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0168-9002(94)91867-8

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A compact polarimeter for the characterization of X-ray polarization has been built and tested. The device permits the measurement of linear polarization by Bragg diffraction and the determination of circular polarization by means of multiple-beam diffraction [1]. This device is small enough to be mounted on the two-theta arm of a 4-circle spectrometer so that the polarization properties of a beam emerging from an X-ray experiment can be determined. We present several schematic views and important details of the device design. In addition we present results obtained in using the polarimeter to characterize both the angular distribution of synchrotron radiation at the CHESS F3 station and from measurements of resonant diffraction in hematite (alpha-Fe2O3) near the iron K-edge.

引用

页码：124 / 127

页数：4

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