ROUGHNESS OF CLEAVED SEMICONDUCTOR SURFACES

被引：143
作者：
HENZLER, M
机构：
[1] TH AACHEN,PHYS INST 2,AACHEN,WEST GERMANY
[2] TECH UNIV CLAUSTHAL,PHYS INST,CLAUSTHAL,WEST GERMANY
来源：
SURFACE SCIENCE | 1973年 / 36卷 / 01期
关键词：
D O I：
10.1016/0039-6028(73)90249-5
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：109 / 122
页数：14
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