CONVERSION FROM AN ENERGY SCALE TO A DEPTH SCALE IN CHANNELING EXPERIMENTS

被引:27
作者
BOTTIGER, J [1 ]
EISEN, FH [1 ]
机构
[1] ROCKWELL INT,SCI CTR,THOUSAND OAKS,CA 91360
关键词
D O I
10.1016/0040-6090(73)90059-X
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:239 / 246
页数:8
相关论文
共 5 条
[1]   DEFECT STUDIES IN CRYSTALS BY MEANS OF CHANNELING [J].
BOGH, E .
CANADIAN JOURNAL OF PHYSICS, 1968, 46 (06) :653-&
[2]  
EDGE RD, 1970, ATOMIC COLLISION PHE
[3]  
Eisen F.H., 1972, RADIAT EFF, V13, P93, DOI [10.1080/00337577208231165, DOI 10.1080/00337577208231165]
[4]   CHANNELING OF MEDIUM-MASS IONS THROUGH SILICON [J].
EISEN, FH .
CANADIAN JOURNAL OF PHYSICS, 1968, 46 (06) :561-&
[5]  
EISEN FH, TO BE PUBLISHED