BACKSCATTERING SECONDARY-ELECTRON CONVERTER

被引：0

作者：

VOLBERT, B ^{[1
]}

REIMER, L ^{[1
]}

机构：

[1] UNIV MUNSTER,INST PHYS,D-4400 MUNSTER,FED REP GER

来源：

MIKROSKOPIE | 1980年 / 36卷 / 11-1期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：347 / 347

页数：1

共 50 条

[1] MONTE-CARLO STUDY OF BACKSCATTERING AND SECONDARY-ELECTRON GENERATION
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[2] THE EFFECT OF ELECTRON BACKSCATTERING ON CONTRAST FORMATION IN THE SECONDARY-ELECTRON PRODUCED IN THE SCANNING ELECTRON-MICROSCOPE
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[4] SECONDARY-ELECTRON EMISSION
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[5] INFLUENCE OF SURFACE-ROUGHNESS ON SECONDARY-ELECTRON EMISSION AND ELECTRON BACKSCATTERING FROM METAL-SURFACE
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[8] SECONDARY-ELECTRON AND BACKSCATTERING MEASUREMENTS FOR POLYCRYSTALLINE COPPER WITH A SPHERICAL RETARDING-FIELD ANALYZER
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