SPECTRAL DEPENDENCE OF PHOTON-CAPTURE CROSS-SECTIONS OF RHENIUM LEVELS IN SILICON

被引：0
|
作者：
YUNUSOV, MS [1 ]
MAKHKAMOV, S [1 ]
MIRZAEV, A [1 ]
机构：
[1] ACAD SCI UZSSR,INST NUCL PHYS,ULUGBEK,UZSSR
来源：
SOVIET PHYSICS SEMICONDUCTORS-USSR | 1977年 / 11卷 / 03期
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中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
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页码：343 / 345
页数：3
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