共 50 条
- [1] Diffraction losses in monocrystalline X-ray refractive lenses EUV AND X-RAY OPTICS: SYNERGY BETWEEN LABORATORY AND SPACE V, 2017, 10235
- [2] ASSESSMENT OF THIN HETEROEPITAXIAL LAYERS USING SKEW ANGLE ASYMMETRICAL X-RAY DOUBLE CRYSTAL DIFFRACTION CHARACTERIZATION OF THE STRUCTURE AND CHEMISTRY OF DEFECTS IN MATERIALS, 1989, 138 : 539 - 544
- [4] Thin layers and multilayers of porous silicon: x-ray diffraction investigation Journal of Applied Physics, 1998, 83 (11 pt 1):
- [5] X-ray diffraction and reflectivity studies of thin porous silicon layers ADVANCES IN MICROCRYSTALLINE AND NANOCRYSTALLINE SEMICONDUCTORS - 1996, 1997, 452 : 437 - 442
- [7] Three-beam X-ray diffraction in crystals with thin strain layers SIXTH INTERNATIONAL CONFERENCE ON CORRELATION OPTICS, 2003, 5477 : 206 - 214
- [9] MEASURING BY DOUBLE DIFFRACTION OF X-RAY DIFFRACTION INDICES ZEITSCHRIFT FUR KRISTALLOGRAPHIE KRISTALLGEOMETRIE KRISTALLPHYSIK KRISTALLCHEMIE, 1969, 128 (3-6): : 448 - &
- [10] X-RAY DETERMINATION OF THE DIFFUSION COEFFICIENTS BY THE METHOD OF DOUBLE THIN METALLIC LAYERS SOVIET PHYSICS-SOLID STATE, 1962, 4 (02): : 334 - 336