DETERMINATION OF ELECTRON-OPTICAL PARAMETERS IN HREM BY IMAGE MATCHING

被引：4
|
作者：
WILSON, AR
机构：
来源：
MICRON | 1980年 / 11卷 / 3-4期
关键词：
D O I：
10.1016/0047-7206(80)90015-1
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：281 / 283
页数：3
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